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    Memory Designline

    Toshiba Claims Highest-Capacity NAND

    By Dylan McGrath 02.20.2019 1
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    SAN FRANCISCO -- Toshiba Memory laid claim to the highest-capacity flash memory device, describing a 96-layer, 1.33-Tb 3D NAND chip in a paper at the International Solid-State Circuits Conference (ISSCC) here Tuesday.

    The Toshiba device stores 4 bits per cell and achieves bit density of 8.5 Gb/mm2 , more than 40% better than a 512-Gb TLC 3D NAND device also described at the ISSCC Tuesday by Toshiba and its partner in NAND development and manufacturing, Western Digital.


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    The device features a die size of 158.4 mm2 . It utilizes a modified source-bias-negative-sense scheme, allowing for deep negative threshold voltage while maintaining a low supply voltage, according to Noboru Shibata, a Toshiba design engineer who presented the paper at ISSCC. The paper was authored by Shibata and a group of engineers from Toshiba and Western Digital.

    The QLC Toshiba device also makes use of a modified two-step programming method, enabling it to realize a narrow threshold voltage for QLC with an 18% reduction in typical page programming time, according to the paper.

    Toshiba ISSCC 13.1: a 1.33-Tb 4-bit/cell 3D-flash memory on a 96-word-line-layer technology

    In the other Toshiba-Western Digital paper presented in the same ISSCC non-volatile memory session, the authors -- led by presenter Seungpil Lee of Western Digital -- describe a 128-layer 3-bit-per-cell 3D NAND device that achieves 66-mm2 die size and 7.8-Gb/mm2 bit density.

    The 128-layer device is enabled by three key technologies, including a four-plane architecture with circuit-under-array technology to improve performance per bit density, a multi-die peak-power management system to manage power consumption and improve write throughput, and a 4-KB page-read mode to reduce power consumption, according to the paper.

    Western Digital ISSCC 13.5: a 512-Gb 3-bit/cell 3D flash memory on 128-wordline-layer with 132-MB/s write performance featuring circuit-under-array technology

    -- Dylan McGrath is the editor-in-chief of EE Times.

    RELATED TOPICS: COMPUTERS AND PERIPHERALS, ICS, RESEARCH & DEVELOPMENT, SEMICONDUCTOR DESIGN & MANUFACTURING, SEMICONDUCTORS

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    Dylan McGrath

    Dylan McGrath is the executive editor of EE Times. With over 20 years experience covering the electronics and semiconductor industry, Dylan has at various times focused on consumer electronics, foundries, EDA, programmable logic, memory, and other specialty areas.


    1 comments
    Post Comment
    resistion 2019-02-21 05:41:30

    Double stacking for 3D NAND is really expensive, worse than planar quadruple patterning. 3D already has double patterning included.

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